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Osamu Ueda Reliability and Degradation of III-V Optical D (Hardback) (UK IMPORT)

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Item specifics

Condition
Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
Book Title
Reliability and Degradation of III-V Optical Devices
Publication Name
Reliability and Degradation of III-V Optical Devices
Title
Reliability and Degradation of III-V Optical Devices
Author
Osamu Ueda
Format
Hardcover
ISBN-10
0890066523
EAN
9780890066522
ISBN
9780890066522
Publisher
Artech House
Genre
Science Nature & Math
Topic
Technology & Engineering
Release Year
1996
Release Date
30/09/1996
Language
English
Country/Region of Manufacture
US
Item Height
6in
Item Length
9in
Item Width
6in
Item Weight
22.9 Oz
Series
Optoelectronics Library
Publication Year
1996
Type
Textbook
Number of Pages
353 Pages

About this product

Product Information

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

Product Identifiers

Publisher
Artech House
ISBN-10
0890066523
ISBN-13
9780890066522
eBay Product ID (ePID)
506505

Product Key Features

Author
Osamu Ueda
Publication Name
Reliability and Degradation of III-V Optical Devices
Format
Hardcover
Language
English
Series
Optoelectronics Library
Publication Year
1996
Type
Textbook
Number of Pages
353 Pages

Dimensions

Item Length
9in
Item Height
6in
Item Width
6in
Item Weight
22.9 Oz

Additional Product Features

Lc Classification Number
Tk7871.85.U33 1996
Table of Content
Introduction. Materials and Structures of Optical Devices: Materials for Optical Devices. Structures of Optical Devices. Crystal Growth: Preparation of Materials by LPE. Preparation of Materials by MOVPE. Preparation of Materials by MBE. Fabrication Processes of Optical Devices: Fabrication Processes. Device Characteristics and Life Testing: Device Characteristics. Life Testing of Devices. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices: Classification of Evaluation Techniques. Visual Inspection. Chemical Etching. Optical Measurement. Electrical Measurement. Structural Evaluation of Semiconductors by Transmission Electron Microscopy. Analytical Techniques. Flow Chart for Evaluation of Degraded Optical Devices. Materials Issues in III-V Compound Semiconductors I -- Defect Generation: Classification of Defects. Growth-induced Defects. Process-induced defects. Materials Issues in III-V Compound Semiconductors I -- Thermal Stability of III-V Alloy Semiconductors: Composition Modulated Structures. Ordered Structures. Influence of Modulated Structures on the Properties and Reliability of Optical Devices. Classification of Degradation Modes and Degradation Phenomena in Optical Devices: Classification of Degradation Modes in the Life Testing of Lasers and LEDs. Classification of Degradation Phenomena in Lasers. Degradation in LEDs. Influence of Stress on the Device Degradation. Degradation I -- Rapid Degradation: Rapid Degradation in GaAlAs/GaAs Optical Devices. Rapid Degradation in InGaAsP/InP Optical Devices. Rapid Degradation in InGaAsP/InGaP Optical Devices. Comparison of Recombination-enhanced Defect Reaction in Different III-V Materials. Elimination of the Rapid Degradation. Degradation II -- Gradual Degradation: Gradual Degradation in GaAlAs DH LEDs. Gradual Degradation in InGaAsP/InP DH LEDs. Comparison of Gradual Degradation in GaAlAs/GaAs and In GaAsP/InP Optical Devices. Enhancement of Gradual Degradation by Internal Stress in GaAlAs Visible Lasers. Degradation III -- Catastrophic Failure: Catastrophic Failure in Lasers. Catastrophic Failure in LEDs. Elimination of Catastrophic Failure.
Copyright Date
1996
Target Audience
Scholarly & Professional
Topic
Electronics / Semiconductors, Physics / Crystallography, Electronics / Optoelectronics
Lccn
96-026600
Dewey Decimal
621.36/93
Dewey Edition
20
Illustrated
Yes
Genre
Technology & Engineering, Science

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