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Fei Wang Zheyu Zhang E Characterization of Wide Bandgap Power Semicon (Hardback)

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Item specifics

Condition
Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
Book Title
Characterization of Wide Bandgap Power Semiconductor Devices
Publication Name
Characterization of Wide Bandgap Power Semiconductor Devices
Title
Characterization of Wide Bandgap Power Semiconductor Devices
Author
Fei Wang, Edward A. Jones, Zheyu Zhang
Format
Hardcover
EAN
9781785614910
ISBN
9781785614910
Publisher
Institution of Engineering & Technology
Genre
Technology & Engineering
Release Year
2018
Release Date
31/10/2018
Language
English
Country/Region of Manufacture
GB
Item Height
234mm
Item Length
9.2in
Series
Energy Engineering Ser.
Publication Year
2018
Type
Textbook
Item Width
6.1in
Number of Pages
347 Pages

About this product

Product Information

This book is an authoritative overview of Wide Bandgap (WBG) device characterization providing essential tools to assist the reader in performing both static and dynamic characterization of WBG devices, particularly those based on using silicon carbide (SiC) and gallium nitride (GaN) power semiconductors.

Product Identifiers

Publisher
Institution of Engineering & Technology
ISBN-10
1785614916
ISBN-13
9781785614910
eBay Product ID (ePID)
242945188

Product Key Features

Author
Fei Wang, Edward A. Jones, Zheyu Zhang
Publication Name
Characterization of Wide Bandgap Power Semiconductor Devices
Format
Hardcover
Language
English
Series
Energy Engineering Ser.
Publication Year
2018
Type
Textbook
Number of Pages
347 Pages

Dimensions

Item Length
9.2in
Item Width
6.1in

Additional Product Features

Lc Classification Number
Qc611.8.W53
Table of Content
Chapter 1: Introduction Chapter 2: Pulsed static characterization Chapter 3: Junction capacitance characterization Chapter 4: Fundamentals of dynamic characterization Chapter 5: Gate drive for dynamic characterization Chapter 6: Layout design and parasitic management Chapter 7: Protection design for double pulse test Chapter 8: Measurement and data processing for dynamic characterization Chapter 9: Cross-talk consideration Chapter 10: Impact of three-phase system Chapter 11: Topology consideration Appendix A: Recommended equipment and components list for DPT setup Appendix B: Data processing code for dynamic characterization
Copyright Date
2018
Target Audience
College Audience
Topic
Electronics / Semiconductors
Dewey Decimal
621.38152
Dewey Edition
23
Genre
Technology & Engineering

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