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Atomic Scale Characterization and First-Principles Studies of Si N Interfaces

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Last updated on May 08, 2024 13:44:12 EDTView all revisionsView all revisions

Item specifics

Condition
Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
PublishedOn
2013-05-28
Title
Atomic Scale Characterization and First-Principles Studies of Si
ISBN
9781461428572
Publication Name
Atomic Scale Characterization and First-Principles Studies of Sin Interfaces
Item Length
9.3in
Publisher
Springer New York
Series
Springer Theses Ser.
Publication Year
2013
Type
Textbook
Format
Trade Paperback
Language
English
Item Height
0.1in
Author
Weronika Walkosz
Item Width
6.1in
Item Weight
16 Oz
Number of Pages
Xiv, 110 Pages

About this product

Product Identifiers

Publisher
Springer New York
ISBN-10
1461428572
ISBN-13
9781461428572
eBay Product ID (ePID)
167481790

Product Key Features

Author
Weronika Walkosz
Publication Name
Atomic Scale Characterization and First-Principles Studies of Sin Interfaces
Format
Trade Paperback
Language
English
Series
Springer Theses Ser.
Publication Year
2013
Type
Textbook
Number of Pages
Xiv, 110 Pages

Dimensions

Item Length
9.3in
Item Height
0.1in
Item Width
6.1in
Item Weight
16 Oz

Additional Product Features

Number of Volumes
1 Vol.
Lc Classification Number
Ta455.C43
Copyright Date
2011
Topic
Spectroscopy & Spectrum Analysis, Chemistry / Physical & Theoretical, Chemistry / General, Materials Science / Ceramics
Intended Audience
Scholarly & Professional
Illustrated
Yes
Genre
Technology & Engineering, Science

Item description from the seller

Business seller information

Value Added Tax Number:
  • GB 724498118
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