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ESD Testing : From Components to Systems, Hardcover by Voldman, Steven H., Li...
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- Buy It NowESD Testing : From Components to Systems, Hardcover by Voldman, Steven H., Li...
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eBay item number:354952444935
Item specifics
- Condition
- Book Title
- ESD Testing : From Components to Systems
- ISBN
- 9780470511916
- Subject Area
- Technology & Engineering
- Publication Name
- Esd Testing : from Components to Systems
- Publisher
- Wiley & Sons, Incorporated, John
- Item Length
- 9.7 in
- Subject
- Electronics / Semiconductors, Electronics / Circuits / Integrated, Electronics / Circuits / General
- Publication Year
- 2016
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 0.8 in
- Item Weight
- 22.4 Oz
- Item Width
- 6.9 in
- Number of Pages
- 328 Pages
About this product
Product Information
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors' series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.
Product Identifiers
Publisher
Wiley & Sons, Incorporated, John
ISBN-10
0470511915
ISBN-13
9780470511916
eBay Product ID (ePID)
228461311
Product Key Features
Number of Pages
328 Pages
Language
English
Publication Name
Esd Testing : from Components to Systems
Publication Year
2016
Subject
Electronics / Semiconductors, Electronics / Circuits / Integrated, Electronics / Circuits / General
Type
Textbook
Subject Area
Technology & Engineering
Format
Hardcover
Dimensions
Item Height
0.8 in
Item Weight
22.4 Oz
Item Length
9.7 in
Item Width
6.9 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2016-023736
Dewey Edition
23
Dewey Decimal
621.38154
Lc Classification Number
Tk7870.285.V65 2016
Copyright Date
2017
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:354952444935
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Hermoso libro..!!!!!.. Muy bien cuidado e impecable empaquetado para envío. Realmente vale cada dólar gastado en el. Manejo y envío muy profesional. Excelente vendedor. Lo recomiendo por la calidad de sus productos, los precios, la comunicación sobre el desarrollo de mi orden y el manejo y envio. Gran experiencia de compra con este vendedor.
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