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Francis Balestra Nanoscale CMOS (Hardback) (UK IMPORT)

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Item specifics

Condition
Brand New: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
Book Title
Nanoscale CMOS
Publication Name
Nanoscale Cmos : Innovative Materials, Modeling and Characterization
Title
Nanoscale CMOS
Subtitle
Innovative Materials, Modeling and Characterization
Author
Francis Balestra
Contributor
Francis Balestra (Edited by)
Format
Hardcover
EAN
9781848211803
ISBN
9781848211803
Publisher
Wiley & Sons, Incorporated, John
Genre
Technology & Engineering
Release Date
11/06/2010
Release Year
2010
Language
English
Country/Region of Manufacture
GB
Item Height
1.6in
Item Length
9.4in
Item Width
6.4in
Item Weight
39.1 Oz
Publication Year
2010
Type
Textbook
Number of Pages
652 Pages

About this product

Product Information

This book provides a comprehensive review of the state-of-the-art in the development of new and innovative materials, and of advanced modeling and characterization methods for nanoscale CMOS devices. Leading global industry bodies including the International Technology Roadmap for Semiconductors (ITRS) have created a forecast of performance improvements that will be delivered in the foreseeable future - in the form of a roadmap that will lead to a substantial enlargement in the number of materials, technologies and device architectures used in CMOS devices. This book addresses the field of materials development, which has been the subject of a major research drive aimed at finding new ways to enhance the performance of semiconductor technologies. It covers three areas that will each have a dramatic impact on the development of future CMOS devices: global and local strained and alternative materials for high speed channels on bulk substrate and insulator; very low access resistance; and various high dielectric constant gate stacks for power scaling. The book also provides information on the most appropriate modeling and simulation methods for electrical properties of advanced MOSFETs, including ballistic transport, gate leakage, atomistic simulation, and compact models for single and multi-gate devices, nanowire and carbon-based FETs. Finally, the book presents an in-depth investigation of the main nanocharacterization techniques that can be used for an accurate determination of transport parameters, interface defects, channel strain as well as RF properties, including capacitance-conductance, improved split C-V, magnetoresistance, charge pumping, low frequency noise, and Raman spectroscopy.

Product Identifiers

Publisher
Wiley & Sons, Incorporated, John
ISBN-10
1848211805
ISBN-13
9781848211803
eBay Product ID (ePID)
102865348

Product Key Features

Author
Francis Balestra
Publication Name
Nanoscale Cmos : Innovative Materials, Modeling and Characterization
Format
Hardcover
Language
English
Publication Year
2010
Type
Textbook
Number of Pages
652 Pages

Dimensions

Item Length
9.4in
Item Height
1.6in
Item Width
6.4in
Item Weight
39.1 Oz

Additional Product Features

Lc Classification Number
Tk7871.99.M44i545
Reviews
"All illustrations including half-tone impressions, graphs, tables and mathematical equations are presented in a manner the design and execution of which are as excellent as the material they go to serve and illustrate." (Current Engineering Practice, 2011)
Copyright Date
2010
Topic
Electronics / Semiconductors, Nanotechnology & Mems
Lccn
2010-012627
Dewey Decimal
621.39/732
Intended Audience
Scholarly & Professional
Dewey Edition
22
Illustrated
Yes
Genre
Technology & Engineering

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